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CMOS Test and Evaluation: A Physical Perspective (in English)
Manjul Bhushan
(Author)
·
Mark B. Ketchen
(Author)
·
Springer
· Hardcover
CMOS Test and Evaluation: A Physical Perspective (in English) - Bhushan, Manjul ; Ketchen, Mark B.
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Synopsis "CMOS Test and Evaluation: A Physical Perspective (in English)"
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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