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Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) (in English)
Nicolas Brodusch; Hendrix Demers; Raynald Gauvin (Author)
·
Springer
· Paperback
Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) (in English) - Nicolas Brodusch; Hendrix Demers; Raynald Gauvin
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Synopsis "Field Emission Scanning Electron Microscopy: New Perspectives for Materials Characterization (Springerbriefs in Applied Sciences and Technology) (in English)"
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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