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Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (in English)
Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.r. Michael (Author)
·
Springer
· Paperback
Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (in English) - Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.R. Michael
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Synopsis "Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition (in English)"
This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
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