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portada Thermal Conductivity Measurements in Atomically Thin Materials and Devices (in English)
Type
Physical Book
Publisher
Language
English
Pages
50
Format
Paperback
Dimensions
23.4 x 15.6 x 0.4 cm
Weight
0.11 kg.
ISBN13
9789811553479

Thermal Conductivity Measurements in Atomically Thin Materials and Devices (in English)

T. Serkan Kasirga (Author) · Springer · Paperback

Thermal Conductivity Measurements in Atomically Thin Materials and Devices (in English) - Kasirga, T. Serkan

Physical Book

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Synopsis "Thermal Conductivity Measurements in Atomically Thin Materials and Devices (in English)"

This book assesses the thermal feasibility of using materials with atomically thin layers such as graphene and the transition metal dichalcogenides family in electronics and optoelectronics applications. The focus is on thermal conductivity measurement techniques currently available for the investigation of thermal performance at the material and device level. In addition to providing detailed information on the available techniques, the book introduces readers to novel techniques based on photothermal effects.

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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.

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