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portada Failure Analysis: High Technology Devices (de Gruyter Stem) (in English)
Type
Physical Book
Author
Publisher
Language
English
Pages
120
Format
Paperback
Dimensions
24.4 x 17.0 x 0.7 cm
Weight
0.22 kg.
ISBN13
9781501524783
Categories

Failure Analysis: High Technology Devices (de Gruyter Stem) (in English)

Daniel J. D. Sullivan (Author) · Eric J. Carleton (Author) · de Gruyter · Paperback

Failure Analysis: High Technology Devices (de Gruyter Stem) (in English) - Sullivan, Daniel J. D. ; Carleton, Eric J.

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Synopsis "Failure Analysis: High Technology Devices (de Gruyter Stem) (in English)"

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.

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