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portada Materials Reliability in Microelectronics Iii: Volume 309 (Mrs Proceedings) (in English)
Type
Physical Book
Illustrated by
Publisher
Author
Year
2014
Language
Inglés
Pages
514
Format
Paperback
Dimensions
22.9 x 15.2 x 2.6 cm
Weight
0.68 kg.
ISBN13
9781107409484
Edition No.
1
Categories

Materials Reliability in Microelectronics Iii: Volume 309 (Mrs Proceedings) (in English)

Kenneth P. Rodbell (Illustrated by) · William F. Filter (Illustrated by) · Harold J. Frost (Illustrated by) · Cambridge University Press · Paperback

Materials Reliability in Microelectronics Iii: Volume 309 (Mrs Proceedings) (in English) - Rodbell, Kenneth P. ; Filter, William F. ; Frost, Harold J.

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Synopsis "Materials Reliability in Microelectronics Iii: Volume 309 (Mrs Proceedings) (in English)"

The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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