menu

0
  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional
portada Modeling and Simulation of Gate Mislaignment Effect in MOSFETs
Type
Physical Book
Format
Paperback
ISBN13
9783639708028

Modeling and Simulation of Gate Mislaignment Effect in MOSFETs

Sharma Rupendra Kumar (Author) · Scholars' Press · Paperback

Modeling and Simulation of Gate Mislaignment Effect in MOSFETs - Sharma Rupendra Kumar

Physical Book

$ 61.75

$ 73.33

You save: $ 11.58

16% discount
  • Condition: New
It will be shipped from our warehouse between Tuesday, June 18 and Wednesday, June 19.
You will receive it anywhere in United States between 1 and 3 business days after shipment.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

All books in our catalog are Original.
The binding of this edition is Paperback.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews