Share
Modeling Nanoscale Imaging in Electron Microscopy (in English)
Vogt, Thomas ; Dahmen, Wolfgang ; Binev, Peter (Author)
·
Springer
· Paperback
Modeling Nanoscale Imaging in Electron Microscopy (in English) - Vogt, Thomas ; Dahmen, Wolfgang ; Binev, Peter
$ 104.20
$ 109.99
You save: $ 5.79
Choose the list to add your product or create one New List
✓ Product added successfully to the Wishlist.
Go to My WishlistsIt will be shipped from our warehouse between
Monday, June 24 and
Tuesday, June 25.
You will receive it anywhere in United States between 1 and 3 business days after shipment.
Synopsis "Modeling Nanoscale Imaging in Electron Microscopy (in English)"
Modeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical methods to resolve problems in microscopy. With improvements in hardware-based aberration software significantly expanding the nanoscale imaging capabilities of scanning transmission electron microscopes (STEM), these mathematical models can replace some labor intensive procedures used to operate and maintain STEMs. This book, the first in its field since 1998, will also cover such relevant concepts as superresolution techniques, special denoising methods, application of mathematical/statistical learning theory, and compressed sensing.
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
- 0% (0)
All books in our catalog are Original.
The book is written in English.
The binding of this edition is Paperback.
✓ Producto agregado correctamente al carro, Ir a Pagar.