Libros importados con hasta 50% OFF + Envío Gratis a todo USA  Ver más

menu

0

My Account

  • argentina
  • chile
  • colombia
  • españa
  • méxico
  • perú
  • estados unidos
  • internacional
portada Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces (in English)
Type
Physical Book
Author
Publisher
Language
English
Pages
200
Format
Hardcover
Dimensions
25.4 x 17.8 x 1.1 cm
Weight
0.54 kg.
ISBN13
9780750346931
Categories

Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces (in English)

Saibal Basu (Author) · Surendra Singh (Author) · Institute of Physics Publishing · Hardcover

Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces (in English) - Basu, Saibal ; Singh, Surendra

Physical Book

$ 180.00

$ 190.00

You save: $ 10.00

5% discount
Envío gratis a todo Estados Unidos
  • Condition: New

Choose the list to add your product or create one New List

Go to My Wishlists
It will be shipped from our warehouse between Monday, June 10 and Tuesday, June 11.
You will receive it anywhere in United States between 1 and 3 business days after shipment.

Synopsis "Neutron and X-ray Reflectometry: Emerging phenomena at heterostructure interfaces (in English)"

This book introduces the techniques of neutron and x-ray reflectometry and presents the studies carried out to date, using the techniques to understand emerging phenomena at the interfaces of thin films.

Customers reviews

More customer reviews
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)
  • 0% (0)

Frequently Asked Questions about the Book

Is the book original?

All books in our catalog are Original.

In what language is the book written?

The book is written in English.

What is the format of this book?

The binding of this edition is Hardcover.

Questions and Answers about the Book

Do you have a question about the book? Login to be able to add your own question.

Opinions about Bookdelivery

More customer reviews