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Reliability Analysis of Electrotechnical Devices (in English)
Tan, Cher Ming (Author)
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Mdpi AG
· Hardcover
Reliability Analysis of Electrotechnical Devices (in English) - Tan, Cher Ming
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Synopsis "Reliability Analysis of Electrotechnical Devices (in English)"
This is a book on the practical approaches of reliability to electrotechnical devices and systems. It includes the electromagnetic effect, radiation effect, environmental effect, and the impact of the manufacturing process on electronic materials, devices, and boards.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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