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portada Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)
Type
Physical Book
Publisher
Author
Format
Hardcover
ISBN13
9789400776623
Categories

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics)

Jacopo Franco (Author) · Springer · Hardcover

Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications (Springer Series in Advanced Microelectronics) - Jacopo Franco

Physical Book

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