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Semiconductor Memories: Technology, Testing, and Reliability (in English)
Ashok K. Sharma (Author)
·
John Wiley & Sons Inc
· Hardcover
Semiconductor Memories: Technology, Testing, and Reliability (in English) - Ashok K. Sharma
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Synopsis "Semiconductor Memories: Technology, Testing, and Reliability (in English)"
Semiconductor Memories provides in-depth coverage in the areas of design for testing, fault tolerance, failure modes and mechanisms, and screening and qualification methods including. * Memory cell structures and fabrication technologies. * Application-specific memories and architectures. * Memory design, fault modeling and test algorithms, limitations, and trade-offs. * Space environment, radiation hardening process and design techniques, and radiation testing. * Memory stacks and multichip modules for gigabyte storage.
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All books in our catalog are Original.
The book is written in English.
The binding of this edition is Hardcover.
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